FT-17

Complex Functional Control Test Bench for Electronic Blocks and Components Model FT-17

FT-17 is a flexible multi-purpose automated test system for functional and parametric control of digital and analog electronic units. The functioning of FT-17 is based on the method of controlling impact generation on the tested unit with further handling of the results. FT-17 can also be used for fault location on the component level with the help of analogue-signature analysis.

Application:

testing and adjustment of electronic units during production
troubleshooting and repair
integration to environmental test benches (temperature, climatic, etc.)
portable test systems
input/Output component control
database
production management
scientific researches.

In addition to general-purpose hardware FT-17 test bench can be fitted with specialized blocks for aircraft, automotive, telecommunications industries or with specially-designed blocks for particular Customer’s needs. For military or transport industry, FT-17 can be provided as portable shielded unit for field conditions or for including as airborne equipment.

FT-17 is certified with the Certificate of confirmation of Military measuring apparatus type.

Description:

FT-17 is designed on the basis of GX7xxx instrumental racks (Marvin Test Solution Inc, USA) with 3 to 20 slots for standard PXI and PXI Express test blocks.

PXI is the most widespread and the most prospective for today industrial standard, maintained by the great number of apparatus manufacturers.

Supporting different PXI block from any manufacturer allows to fit GX7xxx with a wide range of apparatus, e.g. analog meters and generators, input-output digital blocks, multiplexers, programmable and fixed power supply units, interface blocks, image-processing systems, etc.

ATEasy Software:

Windows-based ATEasy software allows on-the-fly test program creation, operator interface creation, accumulation of statistical test results data, new test blocks integration to the system. Using this licensed software and on the basis of performance specification approved by the Customer, we create scalable high-capacity functional test systems allowing the following:

supply voltage with automatic adjustment (min to max in the tolerance range for the tested unit);
digital and analog signals in wide frequency and voltage range;
parameter changing for output signals;
loads emulation;
noise emulation;
data exchange with tested unit;
measured results handling and display on the PC monitor or printing in user-friendly form;
automatic saving of adjustment or inspection protocol with reference to unit serial number, operator, execution time, etc;
accumulation and processing of statistical information;
printing test or adjustment results.

Fixtures:

During the functional test the access to the tested unit is realized through edge connector. For this purpose we use test fixture designed for particular Customer’s device.
Spring loaded test probes are used for contacting. Such method provides up to 3 million contact cycles.

Structure of tester (configuration example):

Instrument Rack and Interface

cabinet 19”
GX7xxx Rack for test blocks for 20 slots, including receiver for test fixture, system power supply units, cooling system.

Installation into cabinet 19”

Test fixture for Customer’s unit
PC-based test controller, installation into cabinet 19”
GX7990 Interface between racks and test controller consisting of two boards and connection cable. One board is installed in test controller,another one – into GX7xxx rack

PXI modules:

GX7400 - frame for power supply modules
GT7430 - programmable power supply module 0-30V, 0-5A
GX1838 - digital-to-analog converter with 8 channels for test signal render to the tested unit
cPCI9112 – Analog-to-digital converter with 16 channels for output signal electrical parameters changing
SMX2044 – digital multimeter for measurement of resistance, capacity, inductivity, frequency
GPIB II – GPIB controller for peripheral devices (oscillograph, power supply, programmable load, etc.)
GX6146C – Scanner-multiplexer 4 groups of 2х16 channels for input and output signal commutation
TDS-2000 – Two-channel digital storage oscillograph TDS2000 series with GPIB interface
ATEasy 6.0 – Software environment for test program creation and execution

Technical specifications

SUPPLY VOLTAGE (TO TESTED UNIT)
Channels with programmable voltage, power up to 150 W
Voltage value	Programmable in range of 0 to 60 V
Accuracy of output set voltage	20 mV
Output voltage pulse level	30 mV max (range)
Output current value	From 0-5 A at output voltage range 0 to 30 V, 0-2.5 A at output voltage range 30 A to 60 A
Power sources	150 W max
Number of channels	4 galvanically isolated channels
Protection	- overvoltage - overload - overheat
Channels with programmable voltage, power up to 2 kW
Voltage value	Programmable in range of 0 to 2000 V
Output current value	0 to 125 A
Power sources	2 kW max (possibility to increase output voltage)
Number of channels	4 galvanically isolated channels (possibility of number of channels extension)
Control	GPIB, RS232, RS485 Interfaces
Protection	- overvoltage - overload - overheat
DIGITAL SYSTEMS
Dynamic digital signals
Maximum test frequency	Up to 200 MHz
Signal levels	programmable level "1": 0-12 V, programmable threshold: 0-8 A (possibility to adjust levels according to the tested unit)
Number of channels	Up to 256 two-direction channels with the possibility of extension up to 1024
Buffer volume	Up to 4 Gbit per channel (depends on the number of used channels)
Static digital signals
Levels of signal	TTL, CMOS, LVDS, open collector programmable level "1": -12 V to +12 V, programmable threshold: 0-8 A (possibility to adjust levels according to the tested unit)
Number of channels	Up to 512 two-direction channels with the possibility of extension up to 1024
SET ANALOGUE SIGNALS
Signal generation with the integrated generator
Signal shape	Sine, saw, meander, signals of random shape, "white noise"
Signal frequency	Up to 2 GHz
Signal measurement with integrated Digital-to-analog converter
Number of channels	64 galvanically isolated channels with possibility of extension
Output voltage value	Programmable in range of -20 V to +32 V
ANALOGUE SIGNALS MEASUREMENT
Signal measurement with integrated Analog-to-digital converter
Number of channels	64 differential channels with possibility of extension
Measurement range	Output voltage range 50 mV/div - 5 V/div Measured signal frequency 2 GHz Input resistance 1 Megohm/15 pF
Signal measurement with the help of integrated multimeter
Voltage measurement range	0 to 330 V with programmable measuring limits
Current measurement range	0 to 2.5 A with programmable measuring limits
Resistance measurement range	0 to 330 MOhms with programmable measuring limits
Frequency measurement range	0 to 300 kHz with programmable measuring limits
FAULT LOCATOR FOR COMPONENT LEVEL
Test ranges	1 V - 500 uA 10 V - 5 mA 10 V - 150 mA 20 V - 1 mA 40 V - 1 mA
Test frequencies	50 Hz 100 Hz 500 Hz 1000 Hz 2000 Hz
Pulse generator	DC Pulse modes 1, 2 Pulse width adjustment Level 0 - 7 A
CONTROL COMPUTER
	Intel P4-based PLC ROBO-2000 mounted in 19" cabinet, monitor, keyboard, mouse, GPIB interface for peripheral units connection
CONNECTION TO TESTED UNIT
	Universal test receiver
GENERAL CHARACTERISTICS
Dimensions	600x800x1700 mm
Weight	110 kg
Power supply	~220 V, 50 Hz
Ambient temperature	10 - 50 ºС
Humidity	20 - 90%

Related products

FT-17HF

The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to analog microchips at maximum frequency of 200 MHz. The complex consists of all-in-one boards which are made by means of “tester-on-channel” technology. Such architecture allows to get maximum measuring possibilities with minimum time control and expanses for gaging production.
In the Complex there can be up to 12 all-in-one boards with 768 outputs and specific boards for mixed-signal components control as well. As additional possibilities of system there can be implemented algorithms of memory structure testing.

Areas of application:

Output control of integrated microchips parameters (in body frame and on semiconductor board) in production and lab terms
Input control of integrated microchips parameters at consumer facilities
Scientific works, microelectronic products boundary parameters control
Learning process, study of principals of microelectronics and test equipment work

Features:

High productivity by means of modern architecture “tester-on channel” and wide range of parallel control possibilities
Multipurpose (both digital and digital-to-analog microchips control)
Flexibility (tester configuration can be easily changed and enlarged if necessary)
Tester measuring part is made in accordance with latest technologies in component basis sphere
Easy creation of testing sequences
Easy maintenance Possibility of direct coupling («hard» coupling) with automated loaders of products (probe stations, tunnel chambers and others)

Technical characteristics:

Number of measuring channels: 768 (up to 12 boards with 64 channels each)
Maximum frequency of test vectors sequence: 400 Mbps
Time parameters input increment: 39 picoseconds
Number of time marks per channel: 4 or 8 (in multiplexing mode)
Maximum channels error: ±250 picoseconds
Test vectors memory depth per channel: 128 Mbit (expansion to 256 Mbit)
Range of voltage assignment: - 2 ... +6 V (or 0… +8 V)
Maximum power: 4 kW
Cooling system: aerial
Compressed air/vacuum: is not required

FT-17DT

Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ development in quality control of microelectronic products). The equipment construction has got ergonomical design which makes it the best solution for consumers who are concerned in certificated microchips tests and who use input control of components small sets at their facilities. As for technical abilities new model FT-17 HF is equal to the previous one, the only difference is in maximum number of pin-electronic modules (FT-17DT has got 4 modules and 256 measuring channels; FT-17HF has got 12 modules and 786 measuring channels). But the main advatntage of FT-17DT system is that this product is absolutely Russian development: from electronics to body frame.

The tester software XperTest is the result of Sovtest ATE specialists’ work as well and it supports Russian language.

Areas of application:

Output control of microelectronic components and systems parameters (in body frame and on semiconductor plate) in production and lab terms.
Input control of microelectronic components and systems parameters at ECB consumer facilities.
Scientific work, control of microelectronic components boundary parameters and systems, certificated tests.

Objects under control and measure:

Digital IS of random logic (PLD, microprocessors, microcontrollers, IS of standard logic, etc.)
Memory devices (RAM, RAM of different types)
Digital-to-analog IS (AD converters, DA converters, on-chip systems)
RFID (RF tags, smart cards)

FT-17R

Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for measurement parameters of direct and alternating current electromagnet relay for suitability to technical and GOST 16121-86 requirements. The relay tester is 19” stand with operator’s working place.

This equipment has got wide area of application. It can be used for control output products at electromagnet relay manufacturing facilities, for input control of relay parameters at consumer production and for control of relay parameters at certificate centers and “second supplier” as well. With the help of this development diagnosis of failure and relay parameters inspections can be held including influence of environment (vibration, shock, climate and other). Relay tester FT-17R is unique with its multifunctionality. Its abilities allow to achieve 6 controlled relay coil and 8 controlled relay contact groups with increasing possibility both of them. In basic configuration there is one working place but it is possible to enlarge number of simultaneous tested relays up to 4 pcs.

With the help of the relay tester FT-17R it is possible to carry out measurements of all the relay characteristics:

voltage and drop-off/pick-up current measurement,
contacts’ resistance and relay coil measurement (4 wire measurement),
isolation resistance measurement,
timing parameters measurement (pick-up time, drop-off time, overshoot time, time of transitional bounce process)
detection of three-point condition and false pick-up (during vibration resistance tests).

Due to latest technologies this tester shortens inspection time which now takes no more than 3 seconds per a relay with 2 contact sets. The equipment can operate in two modes: research mode (“expanded mode”) and presorting mode («valid or faulty»).

The multifunctional relay tester FT-17R provides simultaneous connection of maximum 6 terminal, closing or transfer contacts. It also provides time parameters control in single response and commutation modes.

Parameters under control:

pick-up time is a time interval from the moment of voltage supply on binding to the first contact closure (or contact breaking if relay has only terminal contacts);
drop-off time is a time interval from the moment of removal voltage from binding to the first contact closure (or contact breaking if relay has only terminal contacts);
bounce time at pick-up and drop-off is a time interval from the moment of the first contact closing to the beginning of the last closing, and from the moment of the first breaking to the last contact breaking;
overshoot time at pick-up and drop-off is a time interval from the moment of the first breaking of closing contact to the first closing of terminal contact;
time difference (for relays with more than 1set for switching) is a time interval from the moment of the first closing of any terminal contacts to breaking the last of the terminal contacts at pick-up and drop-off.

When measuring pick-up time, drop-off time, overshoot time and time difference there doesn’t count bounce time.

For relay inspection contact devices made for required types of body frame are used.

Along with the relay tester FT-17R the software is supplied to the customer for carrying out testing process and developing own testing programs for relay inspection by tester’s operator. Additionally there is provided software and equipment set for performing self-diagnostic and metrological calibration tests. Also there are statistics information processing and output.

The multifunctional relay tester FT-17R is included in State register of measuring equipment in Russian Federation, № 48854-12.

Relay tester FT-17R

FT-17

Complex Functional Control Test Bench for Electronic Blocks and Components Model FT-17

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Complex Functional Control Test Bench for Electronic Blocks and Components Model FT-17