- Test equipment for microelectronics and components
- PCB testers
- Analysers of manufacturing defects (MDA)
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The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to...
The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to analog microchips at maximum frequency of 200 MHz. The complex consists of all-in-one boards which are made by means of “tester-on-channel” technology....
Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ development...
Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ development in quality control of microelectronic products). The equipment construction has got ergonomical design which makes it the best solution for ...
Sovtest ATE burn-in complexes are made for widespread use in terms of both series production at the ...
Sovtest ATE burn-in complexes are made for widespread use in terms of both series production at the stage of product manufacturing and during input control at companies who use microelectronics devices and at companies who perform certificated...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for measurement parameters of direct and alternating current electromagnet relay for suitability to technical and GOST 16121-86 requirements. The relay tester...
Complex Functional Control Test Bench for Electronic Blocks and Components Model FT-17
FT-17 is a flexible multi-purpose automated test system for functional and parametric control of digital and analog electronic units. The functioning of FT-17 is based on the method of controlling impact generation on the tested unit with further handling...
Relay module is made for program commutation of input and output signals with the help of relay and...
Relay module is made for program commutation of input and output signals with the help of relay and it structural takes one location in instrument chassis SFX.
The module is built on relay which manages test controller commands.
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The module is built on relay which manages test controller commands.
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The module is made to generate orthogonal pulses with frequency between 1 and 75 000 Hz and to set up...
The module is made to generate orthogonal pulses with frequency between 1 and 75 000 Hz and to set up charges which help to imitate resistible charges within 0.5 and 120 kOhm. The module is for imitating automobile sensors signals (frequented and resistible)...
SDIO modules are developed for functional control of digital devices at maximum frequency 50 MHz and...
SDIO modules are developed for functional control of digital devices at maximum frequency 50 MHz and they are used FT-17 and FTT-17complexes.
SDIO modules allows to perform digital tests at frequency between 5 Hz and 50 MHz when driver input signal...
SDIO modules allows to perform digital tests at frequency between 5 Hz and 50 MHz when driver input signal...
Special purposed chassis SFX is made for building multipurpose, multichannel systems of electronic m...
Special purposed chassis SFX is made for building multipurpose, multichannel systems of electronic modules functional testing and also for systems of information gathering, technical process management and integrated circuits complex testing. Wide ra...