Test equipment for microelectronics and components

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Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ ...
Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ development in quality control of microelectronic products). The equipment construction has got ergonomical design which makes it the best solution for...
Sovtest ATE burn-in complexes are made for widespread use in terms of both series production at the ...
Sovtest ATE burn-in complexes are made for widespread use in terms of both series production at the stage of product manufacturing and during input control at companies who use microelectronics devices and at companies who perform certificated...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for measurement parameters of direct and alternating current electromagnet relay for suitability to technical and GOST 16121-86 requirements. The relay tester...
Microelecrtomechanical systems (MEMS) are not very big devices which are joined with semiconductor devices...
Microelecrtomechanical systems (MEMS) are not very big devices which are joined with semiconductor devices and which combine characteristics of circuits and mechanical components. 

Different types of MEMS demand parameters control in terms...
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